#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900211000
Mfr serial number	STN13024-11000

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	16/07/2002
PROBLEM	NO
PASSED	YES
Run number	20220900211000

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.13285
I_LEAK350V (microA)	0.2022
Substr Origin	288
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	65
R Bias Upper (MOhm)	1.65
R Bias Lower (MOhm)	1.23

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	42.73
20	59.76
30	69.06
40	76.22
50	82.15
60	87.75
70	93.62
80	99.48
90	105.02
100	110.23
110	115.11
120	119.78
130	124.28
140	128.44
150	132.85
160	136.97
170	140.87
180	144.78
190	148.57
200	152.33
210	156
220	159.6
230	163.15
240	166.61
250	170.06
260	173.47
270	176.76
280	180.06
290	183.4
300	186.6
310	189.8
320	192.9
330	196.1
340	199.2
350	202.2
	
#CV	
10	
15	O.L.
20	O.L.
25	2654.9
30	2287.78
35	2031.88
40	1840.54
45	1694.07
50	1584.64
55	1508.31
60	1463.52
65	1440.08
70	1429.33
75	1424.03
80	1421.25
85	1419.1
90	1417.6
95	1416.37
100	1415.44
105	1414.25
110	1413.41
115	1412.66
120	1411.82

#End of manufacturer data file