#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900211256
Mfr serial number	STN13239-11256

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	31/07/2002
PROBLEM	NO
PASSED	YES
Run number	20220900211256

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.15829
I_LEAK350V (microA)	0.2488
Substr Origin	289
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	65
R Bias Upper (MOhm)	1.38
R Bias Lower (MOhm)	1.27

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	485																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	47.79
20	66.71
30	77.55
40	85.95
50	93.03
60	99.88
70	107.11
80	114.52
90	121.75
100	128.6
110	134.88
120	141.19
130	147.09
140	152.78
150	158.29
160	163.64
170	168.74
180	173.85
190	178.82
200	183.8
210	188.5
220	193.2
230	197.8
240	202.3
250	206.8
260	211.2
270	215.7
280	220
290	224.3
300	228.5
310	232.7
320	236.8
330	240.8
340	245
350	248.8
	
#CV	
10	
15	O.L.
20	O.L.
25	2593.9
30	2239.64
35	1992.26
40	1806.7
45	1665.72
50	1561.87
55	1493.43
60	1455.7
65	1437.49
70	1429.44
75	1425.13
80	1422.93
85	1421.33
90	1419.45
95	1418.41
100	1417.33
105	1416.24
110	1415.5
115	1414.42
120	1413.9

#End of manufacturer data file