#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900211264
Mfr serial number	STN13239-11264

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	31/07/2002
PROBLEM	NO
PASSED	YES
Run number	20220900211264

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.12856
I_LEAK350V (microA)	0.1939
Substr Origin	289
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	65
R Bias Upper (MOhm)	1.38
R Bias Lower (MOhm)	1.27

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	42.27
20	58.17
30	67.01
40	73.83
50	79.51
60	84.91
70	90.4
80	95.92
90	101.3
100	106.45
110	111.3
120	115.89
130	120.28
140	124.49
150	128.56
160	132.46
170	136.22
180	139.94
190	143.48
200	147.11
210	150.57
220	154
230	157.36
240	160.65
250	163.91
260	167.12
270	170.17
280	173.3
290	176.36
300	179.38
310	182.5
320	185.4
330	188.3
340	191.1
350	193.9
	
#CV	
10	
15	O.L.
20	O.L.
25	2606.23
30	2249.23
35	1999.86
40	1812.87
45	1671.4
50	1566.96
55	1497.24
60	1457.42
65	1437.88
70	1429.12
75	1424.8
80	1422.27
85	1420.41
90	1418.91
95	1417.64
100	1416.59
105	1415.6
110	1414.8
115	1413.97
120	1413.35

#End of manufacturer data file