#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900211276
Mfr serial number	STN13239-11276

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	31/07/2002
PROBLEM	NO
PASSED	YES
Run number	20220900211276

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.15696
I_LEAK350V (microA)	0.2384
Substr Origin	293
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	80
R Bias Upper (MOhm)	1.38
R Bias Lower (MOhm)	1.27

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	48.03
20	68.12
30	79.86
40	89.04
50	96.8
60	104.01
70	111.09
80	117.86
90	124.32
100	130.41
110	136.18
120	141.7
130	146.78
140	152.03
150	156.96
160	161.82
170	166.41
180	171
190	175.52
200	179.96
210	184.4
220	188.7
230	193
240	197
250	201
260	205.3
270	209.1
280	212.9
290	216.7
300	220.5
310	224.2
320	227.8
330	231.4
340	235
350	238.4
	
#CV	
10	
15	O.L.
20	O.L.
25	O.L.
30	2610.13
35	2316.51
40	2097.29
45	1925.74
50	1789.46
55	1678.17
60	1589.63
65	1522.3
70	1475.59
75	1446.15
80	1428.81
85	1419.36
90	1414.35
95	1411.57
100	1409.79
105	1408.47
110	1407.57
115	1406.6
120	1405.83

#End of manufacturer data file