#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900211279
Mfr serial number	STN13241-11279

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	31/07/2002
PROBLEM	NO
PASSED	YES
Run number	20220900211279

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.1245
I_LEAK350V (microA)	0.1858
Substr Origin	293
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	75
R Bias Upper (MOhm)	1.52
R Bias Lower (MOhm)	1.33

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	41.04
20	56.95
30	65.95
40	72.97
50	78.86
60	84.16
70	89.26
80	94.33
90	99.25
100	103.9
110	108.41
120	112.72
130	116.82
140	120.7
150	124.5
160	128.17
170	131.72
180	135.21
190	138.58
200	141.91
210	145.23
220	148.43
230	151.54
240	154.64
250	157.66
260	160.73
270	163.6
280	166.47
290	169.45
300	172.25
310	175.04
320	177.85
330	180.6
340	183.1
350	185.8
	
#CV	
10	
15	O.L.
20	O.L.
25	2978.47
30	2564.17
35	2276.64
40	2058.92
45	1891.3
50	1758.71
55	1650.57
60	1565.98
65	1503.4
70	1461.39
75	1435.91
80	1421.57
85	1414.29
90	1410.37
95	1408.14
100	1406.61
105	1405.35
110	1404.39
115	1403.49
120	1402.7

#End of manufacturer data file