#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900211320
Mfr serial number	STN13241-11320

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	31/07/2002
PROBLEM	NO
PASSED	YES
Run number	20220900211320

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.12996
I_LEAK350V (microA)	0.1894
Substr Origin	293
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	292
Vdep (V)	75
R Bias Upper (MOhm)	1.52
R Bias Lower (MOhm)	1.33

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	45.02
20	62.26
30	71.87
40	79.42
50	85.53
60	90.86
70	95.82
80	100.69
90	105.54
100	110.2
110	114.48
120	118.58
130	122.57
140	126.34
150	129.96
160	133.49
170	136.85
180	140.23
190	143.49
200	146.7
210	149.89
220	152.98
230	156
240	159.04
250	161.98
260	164.83
270	167.62
280	170.51
290	173.21
300	176.05
310	178.8
320	181.5
330	184.3
340	186.9
350	189.4
	
#CV	
10	
15	O.L.
20	O.L.
25	2965.84
30	2555.48
35	2270.87
40	2055.34
45	1888.95
50	1757.46
55	1650.33
60	1566.39
65	1504
70	1462.02
75	1436.28
80	1421.73
85	1414.01
90	1409.93
95	1407.62
100	1406.05
105	1404.79
110	1403.79
115	1403
120	1402.1

#End of manufacturer data file