#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900211347
Mfr serial number	STN13242-11347

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	05/08/2002
PROBLEM	NO
PASSED	YES
Run number	20220900211347

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.12725
I_LEAK350V (microA)	0.196
Substr Origin	291
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	65
R Bias Upper (MOhm)	1.37
R Bias Lower (MOhm)	1.23

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	41.03
20	56.94
30	65.59
40	72.23
50	78.22
60	84.03
70	89.83
80	95.37
90	100.58
100	105.49
110	110.12
120	114.58
130	119
140	123.17
150	127.25
160	131.24
170	135.21
180	139.04
190	142.84
200	146.54
210	150.31
220	153.95
230	157.51
240	161.1
250	164.63
260	168.15
270	171.33
280	174.91
290	178.23
300	181.6
310	184.7
320	187.8
330	190.7
340	193.5
350	196
	
#CV	
10	
15	O.L.
20	O.L.
25	2639.03
30	2274.56
35	2019.54
40	1829.69
45	1684.19
50	1574.2
55	1498.35
60	1453.74
65	1430.63
70	1419.83
75	1414.69
80	1411.83
85	1409.98
90	1408.52
95	1407.36
100	1406.27
105	1405.34
110	1404.52
115	1403.68
120	1402.93

#End of manufacturer data file