#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900211484
Mfr serial number	STN13245-11484

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	22/08/2002
PROBLEM	NO
PASSED	YES
Run number	20220900211484

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.10408
I_LEAK350V (microA)	0.15533
Substr Origin	291
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	65
R Bias Upper (MOhm)	1.42
R Bias Lower (MOhm)	1.27

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	35.26
20	47.98
30	54.91
40	60.47
50	65.03
60	69.37
70	73.73
80	78.16
90	82.44
100	86.6
110	90.48
120	94.15
130	97.53
140	100.87
150	104.08
160	107.12
170	110.08
180	113.06
190	115.89
200	118.7
210	121.41
220	124.13
230	126.78
240	129.4
250	131.87
260	134.41
270	136.86
280	139.33
290	141.66
300	144.08
310	146.43
320	148.68
330	150.95
340	153.14
350	155.33
	
#CV	
10	
15	O.L.
20	O.L.
25	2790.87
30	2407.65
35	2139.51
40	1938.48
45	1783.76
50	1661.26
55	1565.47
60	1497.93
65	1456.04
70	1443.34
75	1422.96
80	1419.81
85	1421.11
90	1399.37
95	1418.39
100	1416.58
105	1413.09
110	1429.4
115	1470.56
120	1440.15

#End of manufacturer data file