#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900211486
Mfr serial number	STN13245-11486

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	22/08/2002
PROBLEM	NO
PASSED	YES
Run number	20220900211486

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.10101
I_LEAK350V (microA)	0.15206
Substr Origin	291
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	288
Vdep (V)	65
R Bias Upper (MOhm)	1.42
R Bias Lower (MOhm)	1.27

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	34.66
20	47.23
30	54.08
40	59.4
50	63.79
60	67.81
70	71.91
80	76.1
90	80.2
100	84.12
110	87.8
120	91.3
130	94.66
140	97.88
150	101.01
160	104.07
170	106.9
180	109.86
190	112.69
200	115.5
210	118.22
220	120.9
230	123.52
240	126.11
250	128.66
260	131.15
270	133.57
280	136
290	138.39
300	140.79
310	143.11
320	145.37
330	147.62
340	149.85
350	152.06
	
#CV	
10	
15	O.L.
20	O.L.
25	2691.19
30	2321.54
35	2063.11
40	1869.83
45	1721.3
50	1605.44
55	1519.91
60	1465.27
65	1435.23
70	1420.82
75	1414.23
80	1410.77
85	1408.54
90	1406.96
95	1405.68
100	1404.62
105	1403.62
110	1402.84
115	1402.01
120	1401.31

#End of manufacturer data file