#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900211496
Mfr serial number	STN13245-11496

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	22/08/2002
PROBLEM	NO
PASSED	YES
Run number	20220900211496

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.12413
I_LEAK350V (microA)	0.1904
Substr Origin	291
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	70
R Bias Upper (MOhm)	1.42
R Bias Lower (MOhm)	1.27

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	40.66
20	56.4
30	65.11
40	71.87
50	77.54
60	82.71
70	87.85
80	93.06
90	98.09
100	102.89
110	107.42
120	111.64
130	116.03
140	120.13
150	124.13
160	128.02
170	131.76
180	135.49
190	139.14
200	142.75
210	146.27
220	149.71
230	153.1
240	156.43
250	159.68
260	162.92
270	166.03
280	169.19
290	172.33
300	175.4
310	178.48
320	181.5
330	184.5
340	187.5
350	190.4
	
#CV	
10	
15	O.L.
20	O.L.
25	2710.95
30	2339.15
35	2079.08
40	1883.75
45	1733.85
50	1616.58
55	1529.64
60	1473.35
65	1441.23
70	1425.07
75	1417.47
80	1413.73
85	1411.43
90	1409.78
95	1408.47
100	1407.32
105	1406.34
110	1405.56
115	1404.8
120	1404.06

#End of manufacturer data file