#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900211864
Mfr serial number	STN13454-11864

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	18/09/2002
PROBLEM	NO
PASSED	YES
Run number	20220900211864

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.11968
I_LEAK350V (microA)	0.1807
Substr Origin	300
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	85
R Bias Upper (MOhm)	1.4
R Bias Lower (MOhm)	1.27

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	37.7
20	53.57
30	62.13
40	68.93
50	75.03
60	80.56
70	85.51
80	90.19
90	94.84
100	99.42
110	103.82
120	108.08
130	112.03
140	115.88
150	119.68
160	123.33
170	126.85
180	130.42
190	133.78
200	137.12
210	140.41
220	143.53
230	146.4
240	149.66
250	152.78
260	155.8
270	158.72
280	161.64
290	164.49
300	167.34
310	170.11
320	172.77
330	175.32
340	178.06
350	180.7
	
#CV	
10	
15	O.L.
20	O.L.
25	O.L.
30	2791.83
35	2472.9
40	2235.5
45	2050.78
50	1904.2
55	1783.56
60	1683.57
65	1601.21
70	1535.8
75	1487.53
80	1454.08
85	1433.62
90	1421.39
95	1415.46
100	1411.48
105	1409.52
110	1407.86
115	1407.13
120	1406.16

#End of manufacturer data file