#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900211866
Mfr serial number	STN13454-11866

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	18/09/2002
PROBLEM	NO
PASSED	YES
Run number	20220900211866

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.1167
I_LEAK350V (microA)	0.1778
Substr Origin	300
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	85
R Bias Upper (MOhm)	1.4
R Bias Lower (MOhm)	1.27

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	35.76
20	51.04
30	59.39
40	66.39
50	72.75
60	78.16
70	82.95
80	87.55
90	92.12
100	96.63
110	100.97
120	105.18
130	109.11
140	112.92
150	116.7
160	120.35
170	123.81
180	127
190	130.51
200	133.86
210	137.19
220	140.35
230	143.49
240	146.64
250	149.71
260	152.69
270	155.65
280	158.57
290	161.46
300	164.3
310	167.16
320	169.75
330	172.48
340	175.19
350	177.8
	
#CV	
10	
15	O.L.
20	O.L.
25	O.L.
30	2792.67
35	2475.89
40	2237.93
45	2054.75
50	1909.06
55	1788.81
60	1689.22
65	1606.51
70	1541.21
75	1492.66
80	1459.17
85	1438.25
90	1425.42
95	1418.26
100	1414.27
105	1411.77
110	1410.21
115	1408.79
120	1407.59

#End of manufacturer data file