#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900211867
Mfr serial number	STN13454-11867

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	18/09/2002
PROBLEM	NO
PASSED	YES
Run number	20220900211867

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.11441
I_LEAK350V (microA)	0.17401
Substr Origin	300
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	80
R Bias Upper (MOhm)	1.4
R Bias Lower (MOhm)	1.27

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	121																																							
Short																																								
Open	744																																							

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	36.29
20	51.06
30	59.16
40	65.58
50	71.13
60	76.28
70	81.17
80	85.87
90	90.46
100	94.89
110	99.11
120	103.2
130	106.89
140	110.72
150	114.41
160	117.91
170	121.32
180	124.72
190	127.96
200	131.19
210	134.37
220	137.52
230	140.52
240	143.56
250	146.53
260	149.36
270	152.23
280	155.11
290	157.9
300	160.63
310	163.42
320	166.07
330	168.76
340	171.41
350	174.01
	
#CV	
10	
15	O.L.
20	O.L.
25	O.L.
30	2649.46
35	2349.46
40	2125.16
45	1952.99
50	1815.21
55	1702.47
60	1611.54
65	1541.06
70	1489.07
75	1454.87
80	1433.52
85	1421.8
90	1415.53
95	1412.13
100	1409.67
105	1408.52
110	1407.3
115	1406.4
120	1405.73

#End of manufacturer data file