#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900211870
Mfr serial number	STN13454-11870

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	18/09/2002
PROBLEM	NO
PASSED	YES
Run number	20220900211870

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.10956
I_LEAK350V (microA)	0.16489
Substr Origin	301
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	85
R Bias Upper (MOhm)	1.4
R Bias Lower (MOhm)	1.27

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	35.48
20	50.44
30	58.13
40	64.24
50	69.74
60	74.72
70	79.16
80	83.31
90	87.42
100	91.44
110	95.34
120	99.11
130	102.67
140	106.1
150	109.56
160	112.8
170	115.98
180	119.17
190	122.22
200	125.2
210	128.08
220	131.01
230	133.81
240	136.63
250	139.43
260	142.14
270	144.79
280	147.49
290	149.94
300	152.66
310	155.24
320	157.71
330	160.22
340	162.53
350	164.89
	
#CV	
10	
15	O.L.
20	O.L.
25	O.L.
30	2765.91
35	2452.14
40	2217.72
45	2036.12
50	1891.61
55	1772.95
60	1674.94
65	1594.02
70	1530.88
75	1484.41
80	1451.76
85	1430.87
90	1418.93
95	1411.99
100	1408.36
105	1406.03
110	1404.58
115	1403.65
120	1402.94

#End of manufacturer data file