#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900211884
Mfr serial number	STN13454-11884

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	18/09/2002
PROBLEM	NO
PASSED	YES
Run number	20220900211884

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.10438
I_LEAK350V (microA)	0.15931
Substr Origin	301
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	292
Vdep (V)	70
R Bias Upper (MOhm)	1.4
R Bias Lower (MOhm)	1.27

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	33.12
20	45.88
30	52.85
40	58.37
50	63.53
60	68.51
70	73.22
80	77.72
90	82.04
100	86.2
110	90.13
120	93.95
130	97.48
140	100.96
150	104.38
160	107.64
170	110.82
180	114.03
190	117.03
200	120.02
210	122.99
220	125.84
230	128.64
240	131.41
250	134.04
260	136.83
270	139.46
280	142.1
290	144.68
300	147.14
310	149.68
320	152.14
330	154.53
340	156.94
350	159.31
	
#CV	
10	
15	O.L.
20	O.L.
25	2765.71
30	2384.64
35	2115.71
40	1916.99
45	1764.16
50	1646.06
55	1557.39
60	1495.68
65	1456.13
70	1432.47
75	1419.64
80	1412.97
85	1409.73
90	1407.55
95	1406.07
100	1404.88
105	1403.8
110	1402.9
115	1402.21
120	1401.48

#End of manufacturer data file