#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900211888
Mfr serial number	STN13454-11888

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	18/09/2002
PROBLEM	NO
PASSED	YES
Run number	20220900211888

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.10059
I_LEAK350V (microA)	0.15301
Substr Origin	301
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	75
R Bias Upper (MOhm)	1.4
R Bias Lower (MOhm)	1.27

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	33.16
20	46.03
30	52.85
40	58.2
50	62.97
60	67.49
70	71.81
80	76
90	79.99
100	83.8
110	87.46
120	90.98
130	94.32
140	97.53
150	100.59
160	103.75
170	106.76
180	109.73
190	112.64
200	115.46
210	118.31
220	121.03
230	123.69
240	126.31
250	128.92
260	131.48
270	133.95
280	136.45
290	138.92
300	141.34
310	143.66
320	146.11
330	148.48
340	150.78
350	153.01
	
#CV	
10	
15	O.L.
20	O.L.
25	2803.57
30	2415.64
35	2141.64
40	1939.89
45	1784.51
50	1664.17
55	1572.61
60	1507.81
65	1464.98
70	1438.2
75	1422.72
80	1414.8
85	1410.63
90	1408.29
95	1406.62
100	1405.64
105	1404.57
110	1403.62
115	1402.66
120	1402.16

#End of manufacturer data file