#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900211900
Mfr serial number	STN13454-11900

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	18/09/2002
PROBLEM	NO
PASSED	YES
Run number	20220900211900

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.10406
I_LEAK350V (microA)	0.1546
Substr Origin	301
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	80
R Bias Upper (MOhm)	1.4
R Bias Lower (MOhm)	1.27

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	34.15
20	47.46
30	54.75
40	60.56
50	65.54
60	70.24
70	74.6
80	78.76
90	82.85
100	86.8
110	90.57
120	94.19
130	97.54
140	100.8
150	104.06
160	107.2
170	110.1
180	113.02
190	115.85
200	118.58
210	121.37
220	124.06
230	126.64
240	129.16
250	131.71
260	134.17
270	136.52
280	138.92
290	141.23
300	143.57
310	145.82
320	148.06
330	150.27
340	152.49
350	154.6
	
#CV	
10	
15	O.L.
20	O.L.
25	O.L.
30	2664.72
35	2363.64
40	2137.04
45	1963.21
50	1824.1
55	1710.16
60	1617.67
65	1544.7
70	1490.55
75	1454.29
80	1431.27
85	1418.97
90	1412.6
95	1409.2
100	1406.88
105	1405.66
110	1404.32
115	1403.41
120	1402.47

#End of manufacturer data file