#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900211930
Mfr serial number	STN13455-11930

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	18/09/2002
PROBLEM	NO
PASSED	YES
Run number	20220900211930

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.1413
I_LEAK350V (microA)	0.2167
Substr Origin	301
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	75
R Bias Upper (MOhm)	1.49
R Bias Lower (MOhm)	1.28

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	44.69
20	63.02
30	73.19
40	81.1
50	88.24
60	94.71
70	100.6
80	106.13
90	111.71
100	116.91
110	122
120	126.99
130	131.97
140	136.7
150	141.3
160	145.77
170	150.31
180	154.44
190	158.97
200	162.99
210	167.28
220	171.34
230	175.26
240	179.23
250	183.1
260	186.8
270	190.5
280	194.1
290	197.5
300	200.9
310	204.3
320	207.5
330	210.6
340	213.8
350	216.7
	
#CV	
10	
15	O.L.
20	O.L.
25	2879.53
30	2483.24
35	2205.51
40	1997.19
45	1837.21
50	1710.82
55	1610.96
60	1536.51
65	1485.17
70	1452.57
75	1433.76
80	1423.72
85	1418.39
90	1415.48
95	1413.57
100	1412.22
105	1411.12
110	1410.29
115	1409.43
120	1408.58

#End of manufacturer data file