#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900211950
Mfr serial number	STN13456-11950

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	20/09/2002
PROBLEM	NO
PASSED	YES
Run number	20220900211950

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.16877
I_LEAK350V (microA)	0.2611
Substr Origin	301
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	85
R Bias Upper (MOhm)	1.43
R Bias Lower (MOhm)	1.2

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	46.73
20	68.92
30	81.42
40	91.82
50	101.64
60	110.28
70	117.86
80	124.92
90	131.66
100	138.33
110	144.83
120	151.24
130	157.38
140	163.33
150	168.77
160	174.71
170	180.21
180	185.5
190	190.8
200	196
210	201.1
220	206
230	210.5
240	215.4
250	220.1
260	224.1
270	228.8
280	233.3
290	237.5
300	241.6
310	245.7
320	249.8
330	253.6
340	257.3
350	261.1
	
#CV	
10	
15	O.L.
20	O.L.
25	O.L.
30	2784.16
35	2468.08
40	2231.64
45	2048.71
50	1902.94
55	1783.04
60	1683.52
65	1601.24
70	1535.82
75	1487.28
80	1453.84
85	1432.82
90	1420.5
95	1413.97
100	1410.36
105	1408.07
110	1406.53
115	1405.61
120	1404.86

#End of manufacturer data file