#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900211952
Mfr serial number	STN13456-11952

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	20/09/2002
PROBLEM	NO
PASSED	YES
Run number	20220900211952

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.16234
I_LEAK350V (microA)	0.2462
Substr Origin	301
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	80
R Bias Upper (MOhm)	1.43
R Bias Lower (MOhm)	1.2

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	47.58
20	69.39
30	81.43
40	91.27
50	100.38
60	108.39
70	115.36
80	121.83
90	128.18
100	134.37
110	140.14
120	146.08
130	151.66
140	157.11
150	162.34
160	167.45
170	172.38
180	177.25
190	181.8
200	186.5
210	191
220	195.4
230	199.7
240	203.9
250	208.2
260	212.4
270	216.4
280	220.4
290	224.3
300	228.2
310	232
320	235.6
330	239.2
340	242.7
350	246.2
	
#CV	
10	
15	O.L.
20	O.L.
25	O.L.
30	2791.15
35	2474.37
40	2237.16
45	2053.67
50	1907.4
55	1786.9
60	1686.93
65	1603.97
70	1537.59
75	1487.92
80	0.59112
85	1431.53
90	1418.73
95	1411.93
100	1408.38
105	1406.04
110	1404.7
115	1403.55
120	1402.72

#End of manufacturer data file