#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900211965
Mfr serial number	STN13456-11965

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	20/09/2002
PROBLEM	NO
PASSED	YES
Run number	20220900211965

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.15757
I_LEAK350V (microA)	0.2483
Substr Origin	301
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	75
R Bias Upper (MOhm)	1.43
R Bias Lower (MOhm)	1.2

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	45.46
20	65.96
30	77.3
40	86.43
50	94.24
60	102.12
70	109.35
80	116.11
90	122.72
100	128.99
110	135.09
120	140.95
130	146.65
140	152.17
150	157.57
160	162.86
170	167.98
180	173.04
190	178.09
200	182.9
210	187.8
220	192.6
230	197.3
240	202
250	206.6
260	211.1
270	215.6
280	220.1
290	224.4
300	228.5
310	232.6
320	236.8
330	240.9
340	244.8
350	248.3
	
#CV	
10	
15	O.L.
20	O.L.
25	2902.11
30	2498.29
35	2215.88
40	2004.13
45	1841.34
50	1712.9
55	1611.15
60	1535.09
65	1482.11
70	1448.19
75	1428.32
80	1417.34
85	1411.81
90	1408.38
95	1406.62
100	1405.21
105	1404.09
110	1402.98
115	1402.36
120	1401.52

#End of manufacturer data file