#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900211967
Mfr serial number	STN13456-11967

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	20/09/2002
PROBLEM	NO
PASSED	YES
Run number	20220900211967

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.12778
I_LEAK350V (microA)	0.1954
Substr Origin	301
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	75
R Bias Upper (MOhm)	1.43
R Bias Lower (MOhm)	1.2

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	37.87
20	53.87
30	62.66
40	69.86
50	76.11
60	82.46
70	88.3
80	94.19
90	99.62
100	104.71
110	109.94
120	114.51
130	119.18
140	123.46
150	127.78
160	131.9
170	135.88
180	139.85
190	143.55
200	147.31
210	150.89
220	154.47
230	158.02
240	161.4
250	164.9
260	168.05
270	171.39
280	174.49
290	177.72
300	180.7
310	183.6
320	186.7
330	189.7
340	192.5
350	195.4
	
#CV	
10	
15	O.L.
20	O.L.
25	2911.31
30	2507.46
35	2223.62
40	2011.4
45	1848.59
50	1719.85
55	1617.54
60	1539.76
65	1484.74
70	1449.33
75	1428.69
80	1417.69
85	1411.97
90	1408.91
95	1406.91
100	1405.42
105	1404.4
110	1403.32
115	1402.54
120	1402.01

#End of manufacturer data file