#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900211979
Mfr serial number	STN13459-11979

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	20/09/2002
PROBLEM	NO
PASSED	YES
Run number	20220900211979

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.13841
I_LEAK350V (microA)	0.2205
Substr Origin	303
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	75
R Bias Upper (MOhm)	1.45
R Bias Lower (MOhm)	1.25

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	40.77
20	58.53
30	68.46
40	76.19
50	82.81
60	89.17
70	95.46
80	101.6
90	107.55
100	113.21
110	118.6
120	123.6
130	128.77
140	133.64
150	138.41
160	143.11
170	147.7
180	152.26
190	156.71
200	161.08
210	165.43
220	169.61
230	173.76
240	177.98
250	182
260	186
270	190
280	194
290	197.9
300	201.8
310	205.7
320	209.5
330	213.2
340	216.8
350	220.5
	
#CV	
10	
15	O.L.
20	O.L.
25	2930.96
30	2522.96
35	2239.32
40	2024.23
45	1858.8
50	1728.54
55	1624.59
60	1546.21
65	1491.2
70	1456.13
75	1435.48
80	1424.45
85	1418.79
90	1415.75
95	1414
100	1412.55
105	1411.31
110	1410.33
115	1409.63
120	1409.01

#End of manufacturer data file