#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900211980
Mfr serial number	STN13459-11980

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	20/09/2002
PROBLEM	NO
PASSED	YES
Run number	20220900211980

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.13459
I_LEAK350V (microA)	0.2104
Substr Origin	303
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	75
R Bias Upper (MOhm)	1.45
R Bias Lower (MOhm)	1.25

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	39.89
20	57.21
30	66.73
40	74.34
50	80.76
60	87.01
70	92.99
80	99.08
90	104.89
100	110.36
110	115.6
120	120.44
130	125.33
140	130.01
150	134.59
160	139.03
170	143.38
180	147.46
190	151.91
200	155.93
210	160.07
220	163.94
230	167.89
240	171.67
250	175.49
260	179.2
270	182.7
280	186.3
290	189.9
300	193.4
310	196.9
320	200.2
330	203.8
340	207.1
350	210.4
	
#CV	
10	
15	O.L.
20	O.L.
25	2920.33
30	2514.3
35	2232.72
40	2018.72
45	1854.85
50	1725.64
55	1622.3
60	1544.44
65	1489.21
70	1454.46
75	1434.59
80	1424.06
85	1418.71
90	1415.74
95	1413.75
100	1412.35
105	1411.27
110	1410.19
115	1409.46
120	1408.78

#End of manufacturer data file