#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900211982
Mfr serial number	STN13459-11982

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	20/09/2002
PROBLEM	NO
PASSED	YES
Run number	20220900211982

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.13079
I_LEAK350V (microA)	0.2022
Substr Origin	303
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	75
R Bias Upper (MOhm)	1.45
R Bias Lower (MOhm)	1.25

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	39.27
20	55.93
30	65.13
40	72.29
50	78.44
60	84.28
70	90.2
80	96.15
90	101.79
100	107.16
110	112.23
120	117
130	121.83
140	126.38
150	130.79
160	135.01
170	139.14
180	143.19
190	147.13
200	151.01
210	154.88
220	158.64
230	162.25
240	165.89
250	169.48
260	172.98
270	176.4
280	179.87
290	183.1
300	186.3
310	189.6
320	192.8
330	196.1
340	199.2
350	202.2
	
#CV	
10	
15	O.L.
20	O.L.
25	2916.45
30	2510.87
35	2229.51
40	2016.4
45	1852.56
50	1723.46
55	1620.49
60	1543.36
65	1489.48
70	1455.71
75	1436.08
80	1425.87
85	1420.45
90	1417.39
95	1415.45
100	1414.18
105	1413.04
110	1411.99
115	1411.18
120	1410.38

#End of manufacturer data file