#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900211983
Mfr serial number	STN13459-11983

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	20/09/2002
PROBLEM	NO
PASSED	YES
Run number	20220900211983

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.13045
I_LEAK350V (microA)	0.2031
Substr Origin	303
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	75
R Bias Upper (MOhm)	1.45
R Bias Lower (MOhm)	1.25

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	39.04
20	55.84
30	65.1
40	72.39
50	78.57
60	84.5
70	90.37
80	96.11
90	101.55
100	107.03
110	112.12
120	116.96
130	121.6
140	126.07
150	130.45
160	134.74
170	138.87
180	142.92
190	146.86
200	150.78
210	154.65
220	158.44
230	162.15
240	165.88
250	169.5
260	173.05
270	176.59
280	180.08
290	183.4
300	186.7
310	190.1
320	193.4
330	196.6
340	199.9
350	203.1
	
#CV	
10	
15	O.L.
20	O.L.
25	2924.21
30	2516.79
35	2233.95
40	2019.89
45	1855.08
50	1725.02
55	1620.74
60	1542.22
65	1487.07
70	1452.28
75	1432.46
80	1422.15
85	1416.87
90	1413.92
95	1411.98
100	1410.54
105	1409.31
110	1408.47
115	1407.61
120	1406.81

#End of manufacturer data file