#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900211986
Mfr serial number	STN13459-11986

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	20/09/2002
PROBLEM	NO
PASSED	YES
Run number	20220900211986

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.12469
I_LEAK350V (microA)	0.1909
Substr Origin	303
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	75
R Bias Upper (MOhm)	1.45
R Bias Lower (MOhm)	1.25

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	38.18
20	54.11
30	62.86
40	69.69
50	75.52
60	81.26
70	86.87
80	92.38
90	97.68
100	102.72
110	107.52
120	111.96
130	116.49
140	120.65
150	124.69
160	128.67
170	132.55
180	136.34
190	140.03
200	143.62
210	147.12
220	150.55
230	153.97
240	157.32
250	160.64
260	163.88
270	167.06
280	170.2
290	173.29
300	176.35
310	179.39
320	182.2
330	185.2
340	188.1
350	190.9
	
#CV	
10	
15	O.L.
20	O.L.
25	2941.33
30	2531.91
35	2247.7
40	2032.33
45	1867.17
50	1736.54
55	1631.1
60	1550.32
65	1492.16
70	1454.72
75	1432.6
80	1420.55
85	1414.51
90	1411.24
95	1409.33
100	1407.78
105	1406.66
110	1405.7
115	1404.89
120	1404.23

#End of manufacturer data file