#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900211987
Mfr serial number	STN13459-11987

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	20/09/2002
PROBLEM	NO
PASSED	YES
Run number	20220900211987

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.12796
I_LEAK350V (microA)	0.1997
Substr Origin	303
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	70
R Bias Upper (MOhm)	1.45
R Bias Lower (MOhm)	1.25

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	38.81
20	55.16
30	64.06
40	71.03
50	76.85
60	82.53
70	88.27
80	93.98
90	99.55
100	104.81
110	109.75
120	114.58
130	119.15
140	123.58
150	127.96
160	132.14
170	136.1
180	140.35
190	144.22
200	148.13
210	151.96
220	155.7
230	159.48
240	163.1
250	166.63
260	170.2
270	173.66
280	177.13
290	180.5
300	183.7
310	186.8
320	190.1
330	193.4
340	196.6
350	199.7
	
#CV	
10	
15	O.L.
20	O.L.
25	2812.21
30	2420.06
35	2148.23
40	1942.67
45	1785.05
50	1662.29
55	1567.98
60	1502.07
65	1459
70	1433.59
75	1420.12
80	1413.36
85	1409.74
90	1407.5
95	1406.02
100	1404.87
105	1403.88
110	1402.98
115	1402.17
120	1401.48

#End of manufacturer data file