#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900211988
Mfr serial number	STN13459-11988

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	20/09/2002
PROBLEM	NO
PASSED	YES
Run number	20220900211988

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.13705
I_LEAK350V (microA)	0.2167
Substr Origin	303
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	75
R Bias Upper (MOhm)	1.45
R Bias Lower (MOhm)	1.25

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	40.26
20	57.75
30	67.49
40	75.01
50	81.74
60	88.21
70	94.46
80	100.52
90	106.36
100	111.98
110	117.36
120	122.52
130	127.47
140	132.29
150	137.05
160	141.79
170	146.31
180	150.63
190	155.35
200	159.55
210	164.04
220	168.18
230	172.45
240	176.61
250	180.61
260	184.5
270	188.5
280	192.2
290	196.1
300	199.8
310	203.2
320	206.4
330	210.2
340	213.6
350	216.7
	
#CV	
10	
15	O.L.
20	O.L.
25	2882.01
30	2481.68
35	2203.36
40	1992.26
45	1830.45
50	1703.26
55	1602.55
60	1528.56
65	1478.06
70	1446.54
75	1428.36
80	1418.65
85	1413.61
90	1410.76
95	1408.86
100	1407.47
105	1406.39
110	1405.59
115	1404.82
120	1403.8

#End of manufacturer data file