#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900211996
Mfr serial number	STN13459-11996

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	20/09/2002
PROBLEM	NO
PASSED	YES
Run number	20220900211996

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.12658
I_LEAK350V (microA)	0.1981
Substr Origin	303
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	75
R Bias Upper (MOhm)	1.45
R Bias Lower (MOhm)	1.25

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	38.06
20	54.38
30	63.29
40	70.34
50	76.59
60	82.43
70	88.07
80	93.51
90	98.83
100	103.9
110	108.76
120	113.38
130	117.9
140	122.29
150	126.58
160	130.84
170	134.89
180	138.93
190	142.88
200	146.77
210	150.61
220	154.34
230	158.03
240	161.69
250	165.01
260	168.8
270	172.3
280	175.78
290	179.18
300	182.4
310	185.6
320	188.8
330	192
340	195.1
350	198.1
	
#CV	
10	
15	O.L.
20	O.L.
25	2873.61
30	2473.87
35	2195.43
40	1985.04
45	1823.72
50	1696.45
55	1595.5
60	1520.44
65	1469.33
70	1438.21
75	1421.62
80	1413.35
85	1408.87
90	1406.61
95	1404.81
100	1403.65
105	1402.56
110	1401.62
115	1400.93
120	1400.24

#End of manufacturer data file