#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900211997
Mfr serial number	STN13459-11997

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	20/09/2002
PROBLEM	NO
PASSED	YES
Run number	20220900211997

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.12379
I_LEAK350V (microA)	0.1925
Substr Origin	303
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	75
R Bias Upper (MOhm)	1.45
R Bias Lower (MOhm)	1.25

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	617																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	36.75
20	52.37
30	61.03
40	67.81
50	73.7
60	79.58
70	85.45
80	91.11
90	96.55
100	101.68
110	106.52
120	111.11
130	115.52
140	119.67
150	123.79
160	127.86
170	131.77
180	135.61
190	139.36
200	142.85
210	146.67
220	150.24
230	153.72
240	157.35
250	160.71
260	164.03
270	167.29
280	170.51
290	173.5
300	176.84
310	179.96
320	183.1
330	186.2
340	189.4
350	192.5
	
#CV	
10	
15	O.L.
20	O.L.
25	2884.76
30	2483.83
35	2205.12
40	1994.07
45	1832.16
50	1704.8
55	1603.63
60	1528.06
65	1475.85
70	1443.65
75	1425.23
80	1415.43
85	1410.42
90	1407.56
95	1405.77
100	1404.49
105	1403.44
110	1402.55
115	1401.74
120	1400.87

#End of manufacturer data file