#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900212000
Mfr serial number	STN13459-12000

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	20/09/2002
PROBLEM	NO
PASSED	YES
Run number	20220900212000

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.1064
I_LEAK350V (microA)	0.16049
Substr Origin	303
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	75
R Bias Upper (MOhm)	1.45
R Bias Lower (MOhm)	1.25

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	33.3
20	46.84
30	54.32
40	60.18
50	65.3
60	70.28
70	74.97
80	79.48
90	83.87
100	88.05
110	92.02
120	95.83
130	99.48
140	102.99
150	106.4
160	109.68
170	112.86
180	115.82
190	118.97
200	121.89
210	124.76
220	127.57
230	130.24
240	132.97
250	135.6
260	138.26
270	140.85
280	143.38
290	145.89
300	148.39
310	150.83
320	153.3
330	155.72
340	158.12
350	160.49
	
#CV	
10	
15	O.L.
20	O.L.
25	2959.78
30	2547.76
35	2261
40	2043.92
45	1876.97
50	1745.54
55	1639.48
60	1558.36
65	1499.33
70	1460.29
75	1436.65
80	1423.47
85	1416.73
90	1412.73
95	1410.67
100	1409.05
105	1407.72
110	1406.9
115	1406.1
120	1405.18

#End of manufacturer data file