#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900212002
Mfr serial number	STN13459-12002

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	20/09/2002
PROBLEM	NO
PASSED	YES
Run number	20220900212002

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.10904
I_LEAK350V (microA)	0.16439
Substr Origin	303
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	75
R Bias Upper (MOhm)	1.45
R Bias Lower (MOhm)	1.25

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	35.24
20	49.32
30	56.99
40	62.85
50	68.09
60	73
70	77.74
80	82.25
90	86.68
100	90.83
110	94.79
120	98.56
130	102.17
140	105.68
150	109.04
160	112.33
170	115.44
180	118.63
190	121.66
200	124.67
210	127.62
220	130.46
230	133.3
240	136.07
250	138.84
260	141.46
270	144.19
280	146.65
290	149.34
300	151.9
310	154.43
320	156.92
330	159.48
340	161.85
350	164.39
	
#CV	
10	
15	O.L.
20	O.L.
25	2920.07
30	2513.29
35	2229.93
40	2016.05
45	1851.69
50	1722.73
55	1620.51
60	1543.8
65	1489.28
70	1454.2
75	1432.85
80	1421.08
85	1414.8
90	1411.37
95	1409.48
100	1408.1
105	1406.87
110	1405.91
115	1405.06
120	1404.38

#End of manufacturer data file