#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900212007
Mfr serial number	STN13459-12007

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	20/09/2002
PROBLEM	NO
PASSED	YES
Run number	20220900212007

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.12897
I_LEAK350V (microA)	0.2008
Substr Origin	303
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	75
R Bias Upper (MOhm)	1.45
R Bias Lower (MOhm)	1.25

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	39
20	54.79
30	63.75
40	70.84
50	77.1
60	83.16
70	89.1
80	94.91
90	100.48
100	105.77
110	110.81
120	115.58
130	120.19
140	124.64
150	128.97
160	133.18
170	137.34
180	141.38
190	145.34
200	149.25
210	153.07
220	156.82
230	160.47
240	164.12
250	167.69
260	171.22
270	174.7
280	178.12
290	181.1
300	184.7
310	188
320	191.2
330	194.5
340	197.6
350	200.8
	
#CV	
10	
15	O.L.
20	O.L.
25	2889.55
30	2489.31
35	2210.84
40	1999.71
45	1837.57
50	1709.79
55	1607.97
60	1531.87
65	1479.46
70	1447.34
75	1429.45
80	1420.12
85	1415.22
90	1412.32
95	1410.57
100	1409.33
105	1408.35
110	1407.51
115	1406.69
120	1405.96

#End of manufacturer data file