#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900212008
Mfr serial number	STN13459-12008

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	20/09/2002
PROBLEM	NO
PASSED	YES
Run number	20220900212008

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.11013
I_LEAK350V (microA)	0.1668
Substr Origin	303
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	75
R Bias Upper (MOhm)	1.45
R Bias Lower (MOhm)	1.25

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	35.41
20	49.27
30	56.85
40	62.82
50	68.06
60	73
70	77.83
80	82.5
90	87.04
100	91.34
110	95.4
120	99.3
130	102.91
140	106.62
150	110.13
160	113.56
170	116.89
180	120.12
190	123.31
200	126.41
210	129.39
220	132.3
230	135.17
240	138.02
250	140.81
260	143.58
270	146.3
280	148.97
290	151.57
300	154.18
310	156.74
320	159.27
330	161.85
340	164.33
350	166.8
	
#CV	
10	
15	O.L.
20	O.L.
25	2893.14
30	2492.45
35	2213.35
40	2002.75
45	1840.71
50	1712.79
55	1610.97
60	1534.83
65	1482.21
70	1450.01
75	1431.72
80	1422.65
85	1418.02
90	1415.32
95	1413.85
100	1412.51
105	1411.25
110	1410.38
115	1409.85
120	1409.01

#End of manufacturer data file