#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900212009
Mfr serial number	STN13459-12009

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	20/09/2002
PROBLEM	NO
PASSED	YES
Run number	20220900212009

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.14177
I_LEAK350V (microA)	0.2207
Substr Origin	303
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	75
R Bias Upper (MOhm)	1.45
R Bias Lower (MOhm)	1.25

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	42.75
20	60.63
30	70.64
40	78.54
50	85.7
60	92.56
70	98.96
80	105.15
90	111.12
100	116.74
110	122.08
120	127.29
130	132.03
140	137.04
150	141.77
160	146.37
170	150.85
180	155.25
190	159.59
200	163.86
210	168.05
220	172.17
230	176.2
240	180.21
250	184
260	187.8
270	191.6
280	195.4
290	199.2
300	202.9
310	206.6
320	210.3
330	213.8
340	217.3
350	220.7
	
#CV	
10	
15	O.L.
20	O.L.
25	2899.72
30	2497.51
35	2217.49
40	2005.34
45	1842.42
50	1714.12
55	1611.98
60	1535.73
65	1482.28
70	1448.7
75	1429.23
80	1419.51
85	1414.33
90	1411.4
95	1409.54
100	1408.1
105	1407.1
110	1406.2
115	1405.67
120	1404.79

#End of manufacturer data file