#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900212010
Mfr serial number	STN13459-12010

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	20/09/2002
PROBLEM	NO
PASSED	YES
Run number	20220900212010

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.13595
I_LEAK350V (microA)	0.2127
Substr Origin	303
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	75
R Bias Upper (MOhm)	1.45
R Bias Lower (MOhm)	1.25

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short	363																																							
Short	364																																							
Short	365																																							
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA	
DATA	
#IV	
10	40.75
20	57.85
30	67.45
40	75.02
50	81.85
60	88.29
70	94.44
80	100.41
90	106.18
100	111.51
110	116.99
120	122.03
130	126.85
140	131.47
150	135.95
160	140.4
170	144.72
180	149.04
190	153.29
200	157.46
210	161.59
220	165.62
230	169.59
240	173.5
250	177.35
260	181
270	184.8
280	188.4
290	192.1
300	195.7
310	199.3
320	202.6
330	206.2
340	209.8
350	212.7
	
#CV	
10	
15	O.L.
20	O.L.
25	2907.75
30	2502.92
35	2221.25
40	2007.7
45	1844.53
50	1715.8
55	1614.1
60	1537.77
65	1484.67
70	1451.23
75	1431.66
80	1421.52
85	1416.17
90	1413.21
95	1411.43
100	1410.09
105	1409.16
110	1408.31
115	1407.56
120	1406.83

#End of manufacturer data file