#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900212011
Mfr serial number	STN13459-12011

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	20/09/2002
PROBLEM	NO
PASSED	YES
Run number	20220900212011

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.13297
I_LEAK350V (microA)	0.2095
Substr Origin	303
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	75
R Bias Upper (MOhm)	1.45
R Bias Lower (MOhm)	1.25

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	39.34
20	55.89
30	65.22
40	72.61
50	79.19
60	85.66
70	91.8
80	97.71
90	103.44
100	108.9
110	114.13
120	119.15
130	123.71
140	128.51
150	132.97
160	137.39
170	141.72
180	145.97
190	150.1
200	154.15
210	158.21
220	162.2
230	166.12
240	170
250	173.84
260	177.59
270	181.1
280	184.8
290	188.3
300	191.9
310	195.5
320	199
330	202.6
340	206.1
350	209.5
	
#CV	
10	
15	O.L.
20	O.L.
25	2910.34
30	2506.29
35	2225.49
40	2012.71
45	1849.12
50	1720.24
55	1617.83
60	1540.72
65	1486.31
70	1451.82
75	1432.01
80	1421.58
85	1416.26
90	1413.29
95	1411.42
100	1409.96
105	1408.93
110	1407.99
115	1407.21
120	1406.46

#End of manufacturer data file