#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900212012
Mfr serial number	STN13459-12012

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	20/09/2002
PROBLEM	NO
PASSED	YES
Run number	20220900212012

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.12772
I_LEAK350V (microA)	0.1985
Substr Origin	303
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	75
R Bias Upper (MOhm)	1.45
R Bias Lower (MOhm)	1.25

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	37.76
20	53.56
30	62.44
40	69.39
50	75.57
60	81.69
70	87.72
80	93.49
90	99.08
100	104.41
110	109.42
120	114.26
130	118.85
140	123.36
150	127.72
160	131.89
170	136.06
180	139.89
190	144.02
200	147.84
210	151.6
220	155.31
230	158.87
240	162.43
250	165.97
260	169.42
270	172.87
280	176.25
290	179.61
300	182.7
310	185.9
320	189.1
330	192.4
340	195.5
350	198.5
	
#CV	
10	
15	O.L.
20	O.L.
25	2904.96
30	2502.23
35	2222
40	2009.43
45	1846.15
50	1717.35
55	1614.57
60	1537.47
65	1483.79
70	1450.02
75	1430.23
80	1419.89
85	1414.33
90	1411.43
95	1409.44
100	1408.11
105	1406.95
110	1405.9
115	1405.18
120	1404.42

#End of manufacturer data file