#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900212016
Mfr serial number	STN13460-12016

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	24/09/2002
PROBLEM	NO
PASSED	YES
Run number	20220900212016

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.15058
I_LEAK350V (microA)	0.231
Substr Origin	303
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	70
R Bias Upper (MOhm)	1.44
R Bias Lower (MOhm)	1.32

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	47.14
20	66.18
30	76.67
40	84.65
50	91.41
60	97.8
70	104.41
80	111.12
90	117.65
100	123.8
110	129.73
120	135.25
130	140.55
140	145.71
150	150.58
160	155.38
170	160.08
180	164.67
190	169.1
200	173.5
210	177.79
220	181.9
230	185.9
240	190
250	193.8
260	198
270	201.8
280	205.5
290	209.3
300	213
310	216.7
320	220.3
330	224
340	227.5
350	231
	
#CV	
10	
15	O.L.
20	O.L.
25	2723.95
30	2347.52
35	2085.49
40	1887.57
45	1737.32
50	1621.83
55	1537.42
60	1481.15
65	1447.09
70	1428.76
75	1419.56
80	1415.04
85	1412.49
90	1410.76
95	1409.37
100	1408.2
105	1407.2
110	1406.37
115	1405.65
120	1404.89

#End of manufacturer data file