#General information ITEM section %ITEM SERIAL NUMBER 20220900212022 Mfr serial number STN13460-12022 #Test information Test section %TEST TEST DATE (DD/MM/YYYY) 24/09/2002 PROBLEM NO PASSED YES Run number 20220900212022 #Test data Data section %DATA TEMPERATURE (C) 25 I_LEAK150V (microA) 0.13929 I_LEAK350V (microA) 0.2151 Substr Origin 316 Substr Orient 111 Substr R Upper (kOhm.cm) 8 Substr R Lower (kOhm.cm) 4 Thickness (micron) 288 Vdep (V) 80 R Bias Upper (MOhm) 1.44 R Bias Lower (MOhm) 1.32 #Comment section %COMMENT #Defects section %DEFECT #DEFECT NAME Implant-Open Implant-Short Oxide-Punchthrough Pinhole Short Open %WEBLINK #DESCRIPTION URL #IV raw data Raw data section %RAWDATA DATA #IV 10 42.25 20 60.07 30 70.1 40 77.89 50 84.45 60 90.68 70 96.92 80 103.09 90 109.06 100 114.72 110 120.09 120 125.18 130 130.05 140 134.72 150 139.29 160 143.68 170 148 180 152.25 190 156.34 200 160.39 210 164.41 220 168.27 230 172.1 240 175.95 250 179.65 260 183.2 270 186.9 280 190.4 290 193.9 300 197.5 310 201 320 204.4 330 208.1 340 211.6 350 215.1 #CV 10 15 O.L. 20 O.L. 25 O.L. 30 2619.56 35 2325.68 40 2104.29 45 1932.3 50 1795.45 55 1684.24 60 1595.2 65 1527.53 70 1481.26 75 1453.1 80 1437.53 85 1429.44 90 1425.29 95 1422.81 100 1421.24 105 1419.97 110 1418.98 115 1418.2 120 1417.21 #End of manufacturer data file