#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900212025
Mfr serial number	STN13460-12025

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	24/09/2002
PROBLEM	NO
PASSED	YES
Run number	20220900212025

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.1352
I_LEAK350V (microA)	0.2092
Substr Origin	316
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	288
Vdep (V)	70
R Bias Upper (MOhm)	1.44
R Bias Lower (MOhm)	1.32

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	40.65
20	57.6
30	67.06
40	74.51
50	80.68
60	86.55
70	92.88
80	99.14
90	105.18
100	110.86
110	116.1
120	121.22
130	125.87
140	130.71
150	135.2
160	139.54
170	143.87
180	148.01
190	152.04
200	156.12
210	160.01
220	163.83
230	167.61
240	171.4
250	175.03
260	178.62
270	182.1
280	185.6
290	189
300	192.5
310	195.9
320	199.2
330	202.6
340	205.9
350	209.2
	
#CV	
10	
15	O.L.
20	O.L.
25	2850.99
30	2456.25
35	2181.74
40	1974.15
45	1814.91
50	1689.83
55	1593.67
60	1524.79
65	1479.76
70	1453.66
75	1439.8
80	1432.62
85	1428.68
90	1426.23
95	1424.65
100	1423.25
105	1422.23
110	1421.36
115	1420.58
120	1419.77

#End of manufacturer data file