#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900212157
Mfr serial number	STN13466-12157

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	25/09/2002
PROBLEM	NO
PASSED	YES
Run number	20220900212157

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.13901
I_LEAK350V (microA)	0.213
Substr Origin	305
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	75
R Bias Upper (MOhm)	1.42
R Bias Lower (MOhm)	1.26

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	44.14
20	61.8
30	71.54
40	79.45
50	86.43
60	92.82
70	98.76
80	104.5
90	110.06
100	115.37
110	120.42
120	125.3
130	130.13
140	134.61
150	139.01
160	143.4
170	147.74
180	151.95
190	156.06
200	160.1
210	164.14
220	168
230	171.84
240	175.55
250	179.25
260	182.6
270	186.5
280	189.9
290	193.4
300	196.8
310	200.2
320	203.6
330	206.9
340	210.1
350	213
	
#CV	
10	
15	O.L.
20	O.L.
25	2860.5
30	2463.74
35	2187.38
40	1978.7
45	1817.94
50	1691.61
55	1591.38
60	1521.17
65	1473.74
70	1444.95
75	1428.88
80	1421.68
85	1417.39
90	1415.13
95	1412.66
100	1411.26
105	1410.26
110	1412.16
115	1409.22
120	1406.34

#End of manufacturer data file