#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900212167
Mfr serial number	STN13466-12167

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	25/09/2002
PROBLEM	NO
PASSED	YES
Run number	20220900212167

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.15672
I_LEAK350V (microA)	0.2444
Substr Origin	305
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	75
R Bias Upper (MOhm)	1.42
R Bias Lower (MOhm)	1.26

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	67																																							
Pinhole	75																																							
Pinhole	77																																							
Pinhole	82																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section	
%RAWDATA	
DATA	
#IV	
10	48.27
20	68.57
30	80.14
40	89.36
50	97.33
60	104.58
70	111.31
80	117.67
90	123.86
100	129.59
110	135.4
120	140.95
130	146.33
140	151.57
150	156.72
160	161.79
170	166.83
180	171.68
190	176.54
200	181.3
210	186.1
220	190.8
230	195.4
240	200
250	204.4
260	208.9
270	213.1
280	217.9
290	222.1
300	226.2
310	230.2
320	234
330	237.8
340	241.3
350	244.4
	
#CV	
10	
15	O.L.
20	O.L.
25	2962.36
30	2549.75
35	2261.73
40	2044.88
45	1878.15
50	1745.31
55	1639.23
60	1557.77
65	1499.18
70	1460.62
75	1437.49
80	1424.91
85	1418.45
90	1414.92
95	1412.83
100	1411.29
105	1410.17
110	1409.2
115	1408.51
120	1407.75

#End of manufacturer data file