#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900212170
Mfr serial number	STN13466-12170

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	25/09/2002
PROBLEM	NO
PASSED	YES
Run number	20220900212170

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.1999
I_LEAK350V (microA)	0.3208
Substr Origin	305
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	75
R Bias Upper (MOhm)	1.42
R Bias Lower (MOhm)	1.26

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	592																																							
Pinhole	654																																							
Pinhole	714																																							
Pinhole	753																																							
Pinhole	755																																							
Pinhole	760																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL

#IV raw data Raw data section	
%RAWDATA	
DATA	
#IV	
10	59.97
20	97.81
30	120.81
40	130.15
50	137.26
60	142.37
70	148.4
80	155.3
90	161.72
100	167.41
110	172.5
120	180.2
130	187.7
140	194.1
150	199.9
160	206.6
170	212.7
180	218
190	224.1
200	229.6
210	235.9
220	242.4
230	247.7
240	253.5
250	259.6
260	265.5
270	271.6
280	277.7
290	283.8
300	290.2
310	296.2
320	302.2
330	308.7
340	315
350	320.8
	
#CV	
10	
15	O.L.
20	O.L.
25	2945.78
30	2534.21
35	2246.45
40	2029.26
45	1862.7
50	1730.31
55	1625.42
60	1545.09
65	1488.19
70	1452.08
75	1431.32
80	1420.4
85	1414.82
90	1411.84
95	1409.98
100	1408.6
105	1407.57
110	1406.87
115	1405.95
120	1405.33

#End of manufacturer data file