#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900212177
Mfr serial number	STN13466-12177

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	25/09/2002
PROBLEM	NO
PASSED	YES
Run number	20220900212177

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.15226
I_LEAK350V (microA)	0.2309
Substr Origin	305
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	75
R Bias Upper (MOhm)	1.42
R Bias Lower (MOhm)	1.26

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	48.74
20	68.75
30	79.52
40	88.11
50	96.06
60	103.08
70	109.27
80	115.16
90	121.06
100	126.64
110	132
120	137.28
130	142.5
140	147.44
150	152.26
160	156.95
170	161.62
180	166.09
190	170.46
200	174.81
210	179.14
220	183.4
230	187.4
240	191.4
250	195.4
260	199.3
270	203
280	206.8
290	210.5
300	214
310	217.5
320	221
330	224.2
340	227.7
350	230.9
	
#CV	
10	
15	O.L.
20	O.L.
25	2984.95
30	2566.35
35	2275.05
40	2055.45
45	1886.43
50	1751.39
55	1643.11
60	1558.85
65	1497.79
70	1457.69
75	1433.5
80	1420.19
85	1413.29
90	1409.72
95	1407.65
100	1406.13
105	1404.93
110	1404.02
115	1403.29
120	1402.68

#End of manufacturer data file