#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900212477
Mfr serial number	STN13609-12477

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	21/10/2002
PROBLEM	NO
PASSED	YES
Run number	20220900212477

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.14059
I_LEAK350V (microA)	0.2103
Substr Origin	320
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	105
R Bias Upper (MOhm)	1.29
R Bias Lower (MOhm)	1.12

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	40.5
20	59.76
30	70.7
40	80.06
50	88.08
60	95.08
70	101.16
80	106.6
90	111.62
100	116.5
110	121.52
120	126.55
130	131.43
140	136.1
150	140.59
160	144.91
170	149.04
180	152.85
190	156.92
200	160.68
210	164.43
220	168.04
230	171.62
240	175.15
250	178.61
260	181.9
270	185.2
280	188.5
290	191.8
300	195
310	198.1
320	201.2
330	204.3
340	207.3
350	210.3
	
#CV	
10	
15	O.L.
20	O.L.
25	O.L.
30	O.L.
35	2910.45
40	2633.56
45	2416.26
50	2242.58
55	2100.13
60	1980.18
65	1877.8
70	1788.81
75	1711.71
80	1643.45
85	1583.46
90	1532.69
95	1491.03
100	1459.75
105	1436.53
110	1422.18
115	1415.61
120	1407.04

#End of manufacturer data file