#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900212484
Mfr serial number	STN13609-12484

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	21/10/2002
PROBLEM	NO
PASSED	YES
Run number	20220900212484

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.12324
I_LEAK350V (microA)	0.1858
Substr Origin	320
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	80
R Bias Upper (MOhm)	1.29
R Bias Lower (MOhm)	1.12

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	38.37
20	53.88
30	62.71
40	69.83
50	76.09
60	81.77
70	86.92
80	91.97
90	97.11
100	102
110	106.71
120	111.09
130	115.19
140	119.35
150	123.24
160	127.09
170	130.76
180	134.33
190	137.89
200	141.35
210	144.73
220	148.07
230	151.3
240	154.45
250	157.55
260	160.62
270	163.55
280	166.5
290	169.43
300	172.26
310	175.1
320	177.86
330	180.5
340	183.1
350	185.8
	
#CV	
10	
15	O.L.
20	O.L.
25	O.L.
30	2684.29
35	2382.68
40	2156.11
45	1982.49
50	1842.94
55	1728.4
60	1634.7
65	1559.14
70	1501.78
75	1462.26
80	1437.73
85	1423.83
90	1416.91
95	1413.25
100	1410.59
105	1409.46
110	1408.12
115	1407.6
120	1406.5

#End of manufacturer data file