#General information ITEM section %ITEM SERIAL NUMBER 20220900212587 Mfr serial number STN13467-12587 #Test information Test section %TEST TEST DATE (DD/MM/YYYY) 21/10/2002 PROBLEM NO PASSED YES Run number 20220900212587 #Test data Data section %DATA TEMPERATURE (C) 25 I_LEAK150V (microA) 0.11218 I_LEAK350V (microA) 0.17337 Substr Origin 305 Substr Orient 111 Substr R Upper (kOhm.cm) 8 Substr R Lower (kOhm.cm) 4 Thickness (micron) 290 Vdep (V) 70 R Bias Upper (MOhm) 1.51 R Bias Lower (MOhm) 1.29 #Comment section %COMMENT #Defects section %DEFECT #DEFECT NAME Implant-Open Implant-Short Oxide-Punchthrough Pinhole Short Open %WEBLINK #DESCRIPTION URL #IV raw data Raw data section %RAWDATA DATA #IV 10 34.98 20 48.79 30 56.29 40 62.35 50 67.66 60 72.74 70 77.77 80 82.74 90 87.55 100 92.1 110 96.38 120 100.5 130 104.57 140 108.29 150 112.18 160 115.81 170 119.44 180 122.9 190 126.27 200 129.57 210 132.88 220 136.05 230 139.21 240 142.29 250 145.28 260 148.3 270 151.26 280 154.14 290 156.99 300 159.82 310 162.58 320 165.33 330 168.07 340 170.79 350 173.37 #CV 10 15 O.L. 20 O.L. 25 2765.05 30 2383.26 35 2114.4 40 1914.7 45 1762.69 50 1645.73 55 1558.67 60 1499.21 65 1461.33 70 1439.52 75 1427.8 80 1421.95 85 1418.52 90 1416.56 95 1415.05 100 1413.93 105 1413.16 110 1411.98 115 1411.4 120 1410.92 #End of manufacturer data file