#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900212596
Mfr serial number	STN13467-12596

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	21/10/2002
PROBLEM	NO
PASSED	YES
Run number	20220900212596

#Test data Data section	
%DATA	
TEMPERATURE (C)	24
I_LEAK150V (microA)	0.10764
I_LEAK350V (microA)	0.16508
Substr Origin	305
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	70
R Bias Upper (MOhm)	1.51
R Bias Lower (MOhm)	1.29

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	34.5
20	47.77
30	55.02
40	60.81
50	65.97
60	70.74
70	75.4
80	80.03
90	84.51
100	88.77
110	92.79
120	96.64
130	100.35
140	104.11
150	107.64
160	111.08
170	114.49
180	117.8
190	120.97
200	124.13
210	127.22
220	130.2
230	133.14
240	135.97
250	138.86
260	141.7
270	144.46
280	147.19
290	149.83
300	152.52
310	155.16
320	157.74
330	160
340	162.6
350	165.08
	
#CV	
10	
15	O.L.
20	O.L.
25	2808.59
30	2422.01
35	2149.32
40	1947.55
45	1792.4
50	1670.69
55	1577.55
60	1511.13
65	1468.08
70	1443.05
75	1429.85
80	1423.23
85	1419.75
90	1417.51
95	1415.89
100	1414.81
105	1413.88
110	1412.87
115	1412
120	1411.5

#End of manufacturer data file